Browsing by UP Author "Osuch, Piotr Jan"

Browsing by UP Author "Osuch, Piotr Jan"

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  • A geometric approach to group delay network synthesis 
    Osuch, Piotr Jan; Stander, Tinus (Radioengineering Society, 2016-06)
    All-pass networks with prescribed group delay are used for analogue signal processing and equalisation of transmission channels. The state-of-the-art methods for synthesising quasi-arbitrary group delay functions ...
  • A high-Q second-order all-pass delay network in CMOS 
    Osuch, Piotr Jan; Stander, Tinus (Institute of Electrical and Electronics Engineers, 2019-03)
    Analogue signal processing (ASP) is a promising alternative to DSP techniques in future telecommunication and data  processing  solutions.  Second‐order  all‐pass  delay  networks  –  the  building  blocks  of  ASPs  –  ...
  • A millimeter-wave second-order all-pass delay network in BiCMOS 
    Osuch, Piotr Jan; Stander, Tinus (Institute of Electrical and Electronics Engineers, 2018-10)
    Analog signal processing (ASP) is a promising alternative to DSP techniques in millimeter-wave (mm-wave) technologies such as 5G, with the second-order all-pass networks a key building block in ASPs. We present an active ...
  • An on-chip post-production tunable group delay equaliser 
    Osuch, Piotr Jan; Stander, Tinus; International Conference on Actual Problems of Electron Devices Engineering (APEDE) (2014 : Saratov, Russia) (Institute of Electrical and Electronics Engineers, 2014)
    A design method for distributed element on-chip post-production tunable group delay equalising networks is presented. It is shown that a number of adjustable Darlington C-sections can be used to equalise the group delay ...
  • Oscillation-based test applied to a wideband CCII 
    Petrashin, Pablo; Toledo, Luis; Lancioni, Walter; Osuch, Piotr Jan; Stander, Tinus (Hindawi Publishing, 2017)
    Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation ...
  • Oscillation-based test in a CCII-based bandpass filter 
    Osuch, Piotr Jan; Stander, Tinus; Petrashin Pablo; Toledo, Luis; Lancioni, Walter (Institute of Electrical and Electronics Engineers, 2017-02)
    Oscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied to test Second-generation Current Conveyor (CCII) based filters for the first ...