Mtangi, Wilbert; Auret, Francois Danie; Diale, M. (Mmantsae Moche); Meyer, Walter Ernst; Chwanda, Albert; De Meyer, Hannes; Janse van Rensburg, Pieter Johan; Nel, Jacqueline Margot
(American Institute of Physics, 2012-04-16)
We have systematically investigated the effects of high-temperature annealing on ZnO and ZnO
devices using current voltage, deep level transient spectroscopy (DLTS) and Laplace DLTS
measurements. Current–voltage measurements ...